Grain-wise Simulation of Stoachastic Damage and Failure verified on a TiAl Polycrystal

23,36 €

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Artikelnummer: Br-2021-003

Titel: Grain-wise Simulation of Stoachastic Damage and Failure verified on a TiAl Polycrystal
Autor(en): A. Cornec, M. R. Kabir
DOI: 10.48447/Br-2021-003
Veranstaltung: 53. Tagung des Arbeitskreises Bruchmechanik und Bauteilsicherheit
Jahr der Veröffentlichung: 2021
Publikationsart: Tagungspräsentation (PDF)
Sprache: Englisch

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Autor(en): J. Langenberg, S. Münstermann

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Autor(en): E. Breitbarth, T. Strohmann, D. Starostin-Penner

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