Grain-wise Simulation of Stoachastic Damage and Failure verified on a TiAl Polycrystal

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Product Details

Reference: Br-2021-003

Title: Grain-wise Simulation of Stoachastic Damage and Failure verified on a TiAl Polycrystal
Author(s): A. Cornec, M.R. Kabir
DOI: 10.48447/Br-2021-003
Event: 53rd Meeting of the Working Group Fracture Mechanics and Component Safety
Year of publication: 2021
Publication type: conference presentation (PDF)
Language: English

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