Grain-wise Simulation of Stoachastic Damage and Failure verified on a TiAl Polycrystal

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Reference: Br-2021-003

Title: Grain-wise Simulation of Stoachastic Damage and Failure verified on a TiAl Polycrystal
Author(s): A. Cornec, M.R. Kabir
DOI: 10.48447/Br-2021-003
Event: 53rd Meeting of the Working Group Fracture Mechanics and Component Safety
Year of publication: 2021
Publication type: conference presentation (PDF)
Language: English

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            [position] => 2
        )

    [3] => Array
        (
            [name] => Event
            [value] => 53rd Meeting of the Working Group Fracture Mechanics and Component Safety
            [id_feature] => 17
            [position] => 6
        )

    [4] => Array
        (
            [name] => Year of publication
            [value] => 2021
            [id_feature] => 14
            [position] => 7
        )

    [5] => Array
        (
            [name] => Publication type
            [value] => conference paper (PDF)
            [id_feature] => 18
            [position] => 8
        )

    [6] => Array
        (
            [name] => Language
            [value] => German
            [id_feature] => 20
            [position] => 9
        )

)
1

German

€25.00